LARS SCHÜ­CKE, M. SC.

Scientific Assistant

Address:
Ruhr Uni­ver­si­ty Bo­chum
Faculty of Electrical Engineering and Information Technology
Chair of Electrical Engineering and Plasma Technology
Uni­ver­si­taets­stra­sse 150
D-44801 Bo­chum, Germany

Room:
ID 1/521

Phone:
(+49)(0)234 / 32 – 21278

Fax:
(+49)(0)234-32-14230

E-Mail:
schuecke(at)aept.rub.de

Publications

Peters, N., Schücke, L., Ollegott, K., Oberste‐Beulmann, C., Awakowicz, P., & Muhler, M. (2021). Catalyst‐enhanced plasma oxidation of n ‐butane over α‐MnO 2 in a temperature‐controlled twin surface dielectric barrier discharge reactor. Plasma Processes and Polymers, 18(4), 2000127. https://doi.org/10.1002/ppap.202000127 Cite
Schücke, L., Gembus, J.-L., Peters, N., Kogelheide, F., Nguyen-Smith, R. T., Gibson, A. R., Schulze, J., Muhler, M., & Awakowicz, P. (2020). Conversion of volatile organic compounds in a twin surface dielectric barrier discharge. Plasma Sources Science and Technology, 29(11), 114003. https://doi.org/10.1088/1361-6595/abae0b Cite
Kogelheide, F., Offerhaus, B., Bibinov, N., Krajinski, P., Schücke, L., Schulze, J., Stapelmann, K., & Awakowicz, P. (2020). Characterisation of volume and surface dielectric barrier discharges in N 2 –O 2 mixtures using optical emission spectroscopy. Plasma Processes and Polymers, 17(6), 1900126. https://doi.org/10.1002/ppap.201900126 Cite
Mitschker, F., Schücke, L., Hoppe, C., Jaritz, M., Dahlmann, R., de los Arcos, T., Hopmann, C., Grundmeier, G., & Awakowicz, P. (2018). Comparative study on the deposition of silicon oxide permeation barrier coatings for polymers using hexamethyldisilazane (HMDSN) and hexamethyldisiloxane (HMDSO). Journal of Physics D: Applied Physics, 51(23), 235201. https://doi.org/10.1088/1361-6463/aac0ab Cite
Mitschker, F., Steves, S., Gebhard, M., Rudolph, M., Schücke, L., Kirchheim, D., Jaritz, M., Brochhagen, M., Hoppe, C., Dahlmann, R., Böke, M., Benedikt, J., Giner, I., de los Arcos, T., Hopmann, C., Grundmeier, G., Devi, A., & Awakowicz, P. (2017). Influence of PE-CVD and PE-ALD on defect formation in permeation barrier films on PET and correlation to atomic oxygen fluence. Journal of Physics D: Applied Physics, 50(23), 235201. https://doi.org/10.1088/1361-6463/aa6e28 Cite
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